Simplified method for measurements and calculations of coupling coefficients and Q^o factor of high-temperature superconducting dielectric resonators
Jacob, Mohan, Mazierska, Janina, Leong, Kenneth, and Krupka, Jerzy (2001) Simplified method for measurements and calculations of coupling coefficients and Q^o factor of high-temperature superconducting dielectric resonators. IEEE Transactions on Microwave Theory and Techniques, 49 (12). 2401- 2407.
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To accurately determine the surface resistance of high temperature superconducting films, multi-frequency measurements of S^21, S^11 and S^22 and sophisticated data processing are required. As a result, surface resistance measurements and calculations for varying temperatures are very time consuming. In this paper we introduce a simplified method for calculations of the unloaded Q (Q^0) factor, which require measurements of s^11 and s^22 at the lowest temperature only. For all other temperatures s^21 measurements are needed only. The method has shown to give sufficiently accurate Q^0 values, and hence the surface resistance of superconducting samples, as compared to results obtained from S^21, S^11 and S^22 measurements using the transmission mode q-factor technique. The presented method has been tested under different coupling coefficients and frequencies.
|Item Type:||Article (Refereed Research - C1)|
|Keywords:||microwave characterisation, coupling coefficient, S-parameters, dielectric resonator, superconductor, surface resistance|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 100%|
|Deposited On:||24 Oct 2006|
|Last Modified:||31 Jul 2013 15:12|
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