Temperature dependence of relative permittivity and loss tangent of novel transparent substrate material at microwave frequencies
Mazierska, J., Jacob, M.V., and Au Yeung, T.F. (2003) Temperature dependence of relative permittivity and loss tangent of novel transparent substrate material at microwave frequencies. Proceedings of the International Conference on Materials for Advanced Technologies. International Conference on Materials for Advanced Technologies , 7-12 December 2003, Singapore , pp. 224-227.
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Recently a transparent dielectric substrate based on Ba(Sn,Mg,Ta)03 material has been developed for microwave applications. We measured the real relative permittivity of this transparent substrate at frequency of 3.2 GHz using a split post dielectric resonator technique at temperatures from 230 K to 300K, and a high resolution cryogenic post resonator at 9.20Hz from 38K to 88K. The Transmission Mode Q factor Technique was used for data processing to ensure high accuracy of the measurements. Measured values of E/ and tanS of transparent BSMTO turned out 'to be 25.2 and 3.45x 1 0-5 at room temperature respectively. TIle Ba(Sn,MgTa)03 transparent substrate may be useful for miniaturised planar antenna arrays and other microwave applicati011S where transparent substrates are needed.
|Item Type:||Conference Item (Refereed Research Paper - E1)|
|Keywords:||BMT; dielectric resonators; loss tangent; permittivity|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 80%|
86 MANUFACTURING > 8616 Computer Hardware and Electronic Equipment > 861603 Integrated Circuits and Devices @ 20%
|Deposited On:||14 Jul 2010 14:52|
|Last Modified:||12 Feb 2011 03:08|
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