Recent advances in measurements of permittivity and dielectric losses at microwave frequencies
Krupka, Jerzy, Mazierska, Janina E., Jacob, Mohan V., Hartnett, John G., and Tobar, Michael E. (2004) Recent advances in measurements of permittivity and dielectric losses at microwave frequencies. Proceedings of SPIE - the International Society of Optical Engineering. Microwave and Optical Technology 2003 , 11-15 August 2003, Ostrava, Czech Republic , pp. 311-317.
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View at Publisher Website: http://dx.doi.org/10.1117/12.560676
The precise microwave characterization of dielectric materials is an important issue for emerging technologies of the 21st century. In this paper recent advances in resonant techniques for permittivity and dielectric loss tangent measurements of low and medium loss dielectrics at microwave frequencies are presented.
|Item Type:||Conference Item (Refereed Research Paper - E1)|
|Keywords:||dielectric resonators; dielectrics; loss tangent; permittivity|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 51%|
91 ECONOMIC FRAMEWORK > 9105 Measurement Standards and Calibration Services > 910599 Measurement Standards and Calibration Services not elsewhere classified @ 49%
|Deposited On:||06 Jul 2010 13:35|
|Last Modified:||12 Feb 2011 03:08|
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