Measurements of thin resistive films employing split post dielectric resonator technique
Krupka, Jerzy, Jacob, Mohan, Givot, Bradley L., and Derzakowski, Krzysztof (2008) Measurements of thin resistive films employing split post dielectric resonator technique. Proceedings of MIKON 17th International Conference on Microwaves, Radar & Wireless Communications. MIKON 17th International Conference on Microwaves, Radar & Wireless Communications , 19-23 May 2008, Wroclaw, Poland , pp. 892-895.
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Abstract
Split post dielectric resonators have been used for measurements of the surface resistance of thin cermet and patterned metal films deposited on a thin low loss dielectric substrate.
| ID Code: | 7720 |
|---|---|
| Item Type: | Conference Item (Refereed Research Paper - E1) |
| Keywords: | dielectric materials; microwave characterisation; permittivity; wireless communication |
| ISBN: | 978-83-906662-7-3 |
| FoR Codes: | 09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100% |
| SEO Codes: | 81 DEFENCE > 810104 Emerging Defence Technologies @ 40% 86 MANUFACTURING > 8610 Ceramics, Glass and Industrial Mineral Products > 861002 Ceramics @ 30% 89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890103 Mobile Data Networks and Services @ 30% |
| Deposited On: | 16 Jul 2010 14:43 |
| Last Modified: | 14 Jan 2013 16:39 |
| Downloads: | Total: 2 Last 12 Months: 1 |
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