Precise microwave characterization of lanthanum aluminate and LSAT substrates for HTS circuits with superconducting post dielectric resonator
Mazierska, Janina, Jacob, Mohan V., and Krupka, Jerzy (2004) Precise microwave characterization of lanthanum aluminate and LSAT substrates for HTS circuits with superconducting post dielectric resonator. Proceedings of the 6th European Conference on Applied Superconductivity . 6th European Conference on Applied Superconductivity , 14-18 September 2003, Sorrento, Italy , pp. 2708-2715.
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Accurate data of complex permittivity of dielectric substrates is needed for efficient design of HTS microwave planar circuits. We have used a recently developed resonator for precise microwave characterisation of LaAI03 and (La,Sr)(AI,Ta)03 substrates at cryogenic temperatures. The measurement fixture has been fabricated using a post dielectric resonator with superconducting (DyBa2Cu307) end plates and silver-plated copper sidewalls to achieve high sensitivity and resolution of loss tangent measurements. The post resonator together with an appropriate numerical technique has been used to measure the complex permittivity of LAO and LSA T planar dielectrics and can be used for screening of HTS substrates before deposition of HTS films for microwave applications.
|Item Type:||Conference Item (Refereed Research Paper - E1)|
Conference Series Number 181.
|Keywords:||dielectric resonators; lanthanum aluminate; loss tangent; LSAT; permittivity; superconductors|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 51%|
91 ECONOMIC FRAMEWORK > 9105 Measurement Standards and Calibration Services > 910599 Measurement Standards and Calibration Services not elsewhere classified @ 49%
|Deposited On:||08 Sep 2010 08:37|
|Last Modified:||08 Oct 2013 12:30|
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