Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics
Subodh, G., Ratheesh, R., Jacob, M.V., and Sebastian, M.T. (2008) Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics. Journal of Materials Research, 23 (6). pp. 1551-1556.
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View at Publisher Website: http://dx.doi.org/10.1557/JMR.2008.0212
MgTe2O5 ceramics were prepared by solid-state route. These materials were sintered in the temperature range of 640–720 °C. The structure and microstructure of the compound was investigated using x-ray diffraction (XRD), Fourier transform infrared (FTIR), Raman spectroscopy, and scanning electron microscopy (SEM) techniques. The dielectric properties of the ceramics were studied in the frequency range 4–6 GHz. The MgTe2O5 ceramics have a dielectric constant (ϵr) of 10.5, quality factors (Qu × f) of 61000 at 5.3 GHz, and temperature coefficient of resonant frequency (τf) of −45 ppm/°C at the optimized sintering temperature of 700 °C. The microwave dielectric properties of these materials at cryogenic temperatures were also investigated.
|Item Type:||Article (Refereed Research - C1)|
Reproduced with permission from Materials Research Society.
G. Subodh, R. Ratheesh, M.V. Jacob, and M.T Sebastian: Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics. J. Mater. Res. 23, 6 (2008).
|Keywords:||dielectric materials; microwave characterisation; permittivity; wireless communication|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100%|
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|Deposited On:||02 Mar 2010 13:12|
|Last Modified:||18 Oct 2013 00:49|
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