Surface resistance measurements of HTS thin films using SLAO dielectric resonator
Jacob, Mohan V., Mazierska, Janina, Leong, Kenneth, Ledenyov, Dimitri, and Krupka, Jerzy (2003) Surface resistance measurements of HTS thin films using SLAO dielectric resonator. IEEE Transactions on Applied Superconductivity, 13 (2). pp. 2909-2912.
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Surface resistance of HTS films is typically measured using sapphire dielectric rod resonators enclosed in a copper cavity. In this paper we present surface resistance measurements of YBa2Cu3O7 films using strontium lanthanum aluminate (SLAO) at a resonant frequency of 18.2 GHz. We have performed the error analysis of the cavity loaded with SLAO dielectric rod and also verification measurements using two sapphire (Al2O3) rod resonators operating at resonant frequencies of 24.6 GHz and 10 GHz respectively. Good agreement between the values of Rs of two sets of YBCO films measured using the SLAO and the sapphire dielectrics has been obtained after a frequency scaling of Rs was applied. Using different dielectric rods of the same size in the same cavity for measurements of Rs of HTS films it is feasible to do microwave characterization of the same films at differing frequencies.
|Item Type:||Article (Refereed Research - C1)|
|Keywords:||dielectric resonators; high temperature superconductors; SrLAO; surface resistance|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 80%|
86 MANUFACTURING > 8616 Computer Hardware and Electronic Equipment > 861603 Integrated Circuits and Devices @ 20%
|Deposited On:||22 Jan 2010 12:06|
|Last Modified:||18 Oct 2013 00:48|
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