Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonator
Mazierska, Janina, Ledenyov, Dimitri, Jacob, Mohan V., and Krupka, Jerzy (2005) Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonator. Superconductor Science & Technology, 18 (1). pp. 18-23.
|PDF (Published Version) - Repository staff only - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader|
View at Publisher Website: http://dx.doi.org/10.1088/0953-2048/18/1...
Accurate data of complex permittivity of dielectric substrates are needed for efficient design of HTS microwave planar circuits. We have tested MgO substrates from three different manufacturing batches using a dielectric resonator with superconducting parts recently developed for precise microwave characterization of laminar dielectrics at cryogenic temperatures. The measurement fixture has been fabricated using a SrLaAlO3 post dielectric resonator with DyBa2Cu3O7 end plates and silver-plated copper sidewalls to achieve the resolution of loss tangent measurements of 2 × 10^−6. The tested MgO substrates exhibited the average relative permittivity of 9.63 and tanδ from 3.7 × 10^-7 to 2 × 10^-5 at frequency of 10.5 GHz in the temperature range from 14 to 80 K.
|Item Type:||Article (Refereed Research - C1)|
|Keywords:||dielectric resonators; high temperature superconductors; MgO substrates; microwave characterisation; superconductivity; surface resistance|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 60%|
86 MANUFACTURING > 8617 Communication Equipment > 861799 Communication Equipment not elsewhere classified @ 40%
|Deposited On:||15 Jun 2009 15:03|
|Last Modified:||18 Oct 2013 00:37|
Last 12 Months: 0
|Citation Counts with External Providers:|
Repository Staff Only: item control page