A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuits
Jacob, Mohan V., Mazierska, Janina, and Krupka, Jerzy (2004) A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuits. Superconductor Science & Technology, 17 (3). pp. 358-362.
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A novel dielectric resonator operating at cryogenic temperatures (14–85 K) at a frequency of 10 GHz for measurements of permittivity and loss tangent of dielectric substrates for HTS microwave circuits is presented. We have fabricated a prototype post dielectric resonator, with superconducting (DyBa2Cu3O7) end plates and silver-plated copper sidewalls to improve the sensitivity and resolution of loss tangent measurements. Also a numerical technique for calculations of permittivity and loss tangent from the resonant frequency and the Q-factor is presented in the paper. For verification of the technique, measurements of the real part of the permittivity of a single crystal quartz substrate have been performed and a very good agreement with published data using the whispering gallery mode technique has been obtained.
|Item Type:||Article (Refereed Research - C1)|
|Keywords:||dielectric resonators; loss tangent; permittivity; post dielectric resonator; substrate; superconductors|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 60%|
91 ECONOMIC FRAMEWORK > 9105 Measurement Standards and Calibration Services > 910599 Measurement Standards and Calibration Services not elsewhere classified @ 40%
|Deposited On:||11 Jun 2009 09:43|
|Last Modified:||18 Oct 2013 00:37|
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