Surface resistance measurements of surface and interface sides of YBa2Cu3O7 films on sapphire and LaAlO3

Abstract

We have measured the surface resistance of YBCO superconducting thin films deposited on sapphire and lanthanum aluminate substrates at the film side and at the interface between the substrate and the film. The measured difference in the Rs values of the interface and the film sides was between 30% and 60% for the YBCO films on LAO in the temperature range 15–80 K. For the Ag-doped films on sapphire the difference in Rs monotonically varied from 10% to 65% when temperature increased from 30 K to 80 K.