Surface resistance measurements of surface and interface sides of YBa2Cu3O7 films on sapphire and LaAlO3
Jacob, Mohan V., Mazierska, Janina, and Lorenz, Michael (2003) Surface resistance measurements of surface and interface sides of YBa2Cu3O7 films on sapphire and LaAlO3. Superconductor Science & Technology, 16 (3). pp. 412-415.
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We have measured the surface resistance of YBCO superconducting thin films deposited on sapphire and lanthanum aluminate substrates at the film side and at the interface between the substrate and the film. The measured difference in the Rs values of the interface and the film sides was between 30% and 60% for the YBCO films on LAO in the temperature range 15–80 K. For the Ag-doped films on sapphire the difference in Rs monotonically varied from 10% to 65% when temperature increased from 30 K to 80 K.
|Item Type:||Article (Refereed Research - C1)|
|Keywords:||dielectric resonators; high temperature superconductors; interfaces; surface resistance|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||89 INFORMATION AND COMMUNICATION SERVICES > 8901 Communication Networks and Services > 890199 Communication Networks and Services not elsewhere classified @ 60%|
86 MANUFACTURING > 8616 Computer Hardware and Electronic Equipment > 861603 Integrated Circuits and Devices @ 40%
|Deposited On:||17 Jun 2009 08:48|
|Last Modified:||18 Oct 2013 00:36|
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