How accurately can the surface resistance of various superconducting films be measured with the sapphire Hakki–Coleman dielectric resonator technique?
Mazierska, Janina, and Jacob, Mohan V. (2006) How accurately can the surface resistance of various superconducting films be measured with the sapphire Hakki–Coleman dielectric resonator technique? Journal of Superconductivity and Novel Magnetism, 19 (7-8). pp. 649-655.
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It has been shown in the past that a random uncertainty in surface resistance measurements of HTS films as low as 1.1% can be achieved. However for comparative studies between differing samples and different laboratories the absolute uncertainty should be used instead. In this paper we discuss random and absolute uncertainties of R S measurements for three types of superconducting thin films, namely YBa2Cu3O7−δ, Tl(Ba,Sr)2Ca2Cu3Oy, and MgB2 when using an optimized Hakki–Coleman dielectric resonator.
|Item Type:||Article (Refereed Research - C1)|
|Keywords:||superconductors; microwave loss; surface resistance; loss tangent; dielectric resonators; superconducting thin film|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091201 Ceramics @ 100%|
|SEO Codes:||97 EXPANDING KNOWLEDGE > 970102 Expanding Knowledge in the Physical Sciences @ 60%|
86 MANUFACTURING > 8617 Communication Equipment > 861799 Communication Equipment not elsewhere classified @ 40%
|Deposited On:||18 Jun 2009 11:32|
|Last Modified:||18 Oct 2013 00:35|
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