Microwave characterisation of dielectric materials - an overview

Abstract

Dielectric materials are the backbone of all high frequency communicatiol1 devices and circuits. The size and quality of the devices depends on the dielectric properties. Therefore it is critical 10 measure the dielectric properties of the material at high frequencies. especially in the microwave region. During the last decade more and more superconducting devices are available in the market. This makes the need for understanding the dielectric properties at cryogenic temperature. The goal of this paper is to review various dielectric characterization techniques implemented at the high electromagnetic frequency region. The typical dielectric properties of the material are the dielectric constant and loss tangent. The paper also will address the microwave cryogenic characterization of dielectric materials. The cryogenic microwave properties of many bulk and planar (substrate) dielectric resonator materials are presented.