Optical properties of thermally evaporated PDI-8CN2 thin films
Anderson, L., Di Girolamo, F., Barra, M., Cassinese, A., and Jacob, M.V. (2011) Optical properties of thermally evaporated PDI-8CN2 thin films. Physics Procedia, 14 . pp. 29-33.
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DOI: 10.1016/j.phpro.2011.05.007
View at Publisher Website: http://dx.doi.org/10.1016/j.phpro.2011.0...
Abstract
The optical properties of thermally evaporated PDI-8CN2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 – 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.
| ID Code: | 21166 |
|---|---|
| Item Type: | Article (Refereed Research - C1) |
| Keywords: | perylene; optical anisotropy; ellipsometry |
| FoR Codes: | 09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100% |
| SEO Codes: | 97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100% |
| Deposited On: | 26 Mar 2012 09:38 |
| Last Modified: | 30 Apr 2013 02:01 |
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