Optical properties of thermally evaporated PDI-8CN2 thin films
Anderson, L., Di Girolamo, F., Barra, M., Cassinese, A., and Jacob, M.V. (2011) Optical properties of thermally evaporated PDI-8CN2 thin films. Physics Procedia, 14 . pp. 29-33.
|PDF (Published Version) - Repository staff only - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader|
View at Publisher Website: http://dx.doi.org/10.1016/j.phpro.2011.0...
The optical properties of thermally evaporated PDI-8CN2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 – 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.
|Item Type:||Article (Refereed Research - C1)|
|Keywords:||perylene; optical anisotropy; ellipsometry|
|FoR Codes:||09 ENGINEERING > 0912 Materials Engineering > 091208 Organic Semiconductors @ 100%|
|SEO Codes:||97 EXPANDING KNOWLEDGE > 970109 Expanding Knowledge in Engineering @ 100%|
|Deposited On:||26 Mar 2012 09:38|
|Last Modified:||30 Apr 2013 02:01|
Last 12 Months: 0
|Citation Counts with External Providers:||Web of Science: 0|
Repository Staff Only: item control page