Measurement and analysis of the dextran partition coefficient in sucrose crystallization

Abstract

The effect of crystallization conditions on the dextran partition coefficient between impure syrup and sugar crystal has been investigated in a batch crystallizer. The crystallizer is operated isothermally at temperatures of 30, 40, and 50 °C, at constant relative supersaturations of 0.05, 0.07, and 0.09, and with mother liquor dextran concentrations of 1000 and 2000 ppm/Brix. The dextran content has been determined by the CSR method. A 1:1 mass ratio of high-fraction dextran (approximately 250,000 Da) and low-fraction dextran (60,000–90,000 Da) is used to represent a wide range of dextran contamination. It is seen that the dextran partition coefficient in sucrose crystallization increases with both increasing supersaturation and increasing crystallization temperature. However it appears that these are secondary effects, with the partition coefficient strongly correlating with crystal growth rate alone, despite the regressed data having large variations in temperature, mother liquor dextran content, and supersaturation. Dextran incorporation into the sugar crystal results from both dextran adsorption onto the crystal surface and mother liquor inclusions. The explanation for the variation in the dextran content in sugar crystal with respect to the growth rate is due to increased adsorption due to the higher surface roughness of crystals grown at high growth rates. Although the dextran concentration in the solution affects the dextran content in the crystal, it does not strongly affect the dextran partition coefficient.